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Wafer-recyclable, environment-friendly transfer printing for large-scale thin-film nanoelectronics

  • Dae Seung Wie
  • , Yue Zhang
  • , Min Ku Kim
  • , Bongjoong Kim
  • , Sangwook Park
  • , Young Joon Kim
  • , Pedro P. Irazoqui
  • , Xiaolin Zheng
  • , Baoxing Xu
  • , Chi Hwan Lee

Research output: Contribution to journalArticlepeer-review

Abstract

Transfer printing of thin-film nanoelectronics from their fabrication wafer commonly requires chemical etching on the sacrifice of wafer but is also limited by defects with a low yield. Here, we introduce a wafer-recyclable, environment-friendly transfer printing process that enables the wafer-scale separation of high-performance thin-film nanoelectronics from their fabrication wafer in a defect-free manner that enables multiple reuses of the wafer. The interfacial delamination is enabled through a controllable cracking phenomenon in a water environment at room temperature. The physically liberated thin-film nanoelectronics can be then pasted onto arbitrary places of interest, thereby endowing the particular surface with desirable add-on electronic features. Systematic experimental, theoretical, and computational studies reveal the underlying mechanics mechanism and guide manufacturability for the transfer printing process in terms of scalability, controllability, and reproducibility.

Original languageEnglish (US)
Pages (from-to)E7236-E7244
JournalProceedings of the National Academy of Sciences of the United States of America
Volume115
Issue number31
DOIs
StatePublished - Jul 31 2018
Externally publishedYes

Keywords

  • Delamination
  • Internet of Things
  • Nondestructive wafer recycling
  • Thin-film nanoelectronics
  • Transfer printing method

ASJC Scopus subject areas

  • General

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