TY - GEN
T1 - Using geometric properties for correspondence-less image alignment
AU - Govindu, Venu
AU - Shekhar, Chandra
AU - Chellappa, Rama
PY - 1998
Y1 - 1998
N2 - We describe a framework for image alignment that does not use explicit feature correspondences. We show how certain geometric properties of image contours are related to the parameters of the geometric transformation between the images. For a transformation model, we show how to recover the transformation parameters using simple statistical distributions of geometric properties. The use of these statistical descriptions eliminates the need for establishing explicit feature correspondence. The proposed method is robust to problems of occlusion, clutter and errors in low-level processing. We demonstrate the effectiveness of our method on real images.
AB - We describe a framework for image alignment that does not use explicit feature correspondences. We show how certain geometric properties of image contours are related to the parameters of the geometric transformation between the images. For a transformation model, we show how to recover the transformation parameters using simple statistical distributions of geometric properties. The use of these statistical descriptions eliminates the need for establishing explicit feature correspondence. The proposed method is robust to problems of occlusion, clutter and errors in low-level processing. We demonstrate the effectiveness of our method on real images.
UR - https://www.scopus.com/pages/publications/105035547325
UR - https://www.scopus.com/pages/publications/105035547325#tab=citedBy
U2 - 10.1109/ICPR.1998.711074
DO - 10.1109/ICPR.1998.711074
M3 - Conference contribution
AN - SCOPUS:105035547325
SN - 0818685123
SN - 9780818685125
T3 - Proceedings - International Conference on Pattern Recognition
SP - 37
EP - 41
BT - Proceedings - 14th International Conference on Pattern Recognition, ICPR 1998
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 14th International Conference on Pattern Recognition, ICPR 1998
Y2 - 16 August 1998 through 20 August 1998
ER -