The value of preoperative tests in the selection of blind patients for a permanent microelectronic implant

Douglas Yanai, Rohit R. Lakhanpal, James D. Weiland, Manjunatha Mahadevappa, Gretchen Van Boemel, Gildo Y. Fujii, Robert Greenberg, Sean Caffey, Eugene De Juan, Mark S. Humayun, Donald G. Puro, Kenneth W. Wright, Froncie A. Gutman, David L. Knox

Research output: Contribution to journal › Article › peer-review