TY - GEN
T1 - Simulation of mechanical misalignments in a conebeam micro-CT system
AU - Vidal-Migallön, I.
AU - Abella, M.
AU - Sisniega, A.
AU - Vaquero, J. J.
AU - Desco, M.
PY - 2008
Y1 - 2008
N2 - X-ray CT images usually show artefacts due not only to physical effects -e.g., beam hardening-, but also to misalignments that remain after mechanical calibration. These artefacts become particularly noticeable in the case of high spatial resolution systems and in hybrid systems, such as PETCT, SPECT-CT scanners, which rely on a correct registration of emission and CT data. Hence, slight mechanical misalignments affect the quality of the CT images and any attenuation correction methods or further quantification based on them. We implemented a computer simulator of these artefacts on a conebeam, flat-panel based micro-CT scanner. Using this simulator, we studied the effect of these different misalignments (pitch and roll tilts, skew and shifts) on reconstructed images.
AB - X-ray CT images usually show artefacts due not only to physical effects -e.g., beam hardening-, but also to misalignments that remain after mechanical calibration. These artefacts become particularly noticeable in the case of high spatial resolution systems and in hybrid systems, such as PETCT, SPECT-CT scanners, which rely on a correct registration of emission and CT data. Hence, slight mechanical misalignments affect the quality of the CT images and any attenuation correction methods or further quantification based on them. We implemented a computer simulator of these artefacts on a conebeam, flat-panel based micro-CT scanner. Using this simulator, we studied the effect of these different misalignments (pitch and roll tilts, skew and shifts) on reconstructed images.
UR - http://www.scopus.com/inward/record.url?scp=67649165801&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=67649165801&partnerID=8YFLogxK
U2 - 10.1109/NSSMIC.2008.4774364
DO - 10.1109/NSSMIC.2008.4774364
M3 - Conference contribution
AN - SCOPUS:67649165801
SN - 9781424427154
T3 - IEEE Nuclear Science Symposium Conference Record
SP - 5007
EP - 5009
BT - 2008 IEEE Nuclear Science Symposium Conference Record, NSS/MIC 2008
T2 - 2008 IEEE Nuclear Science Symposium Conference Record, NSS/MIC 2008
Y2 - 19 October 2008 through 25 October 2008
ER -