Sequential Score Adaptation with Extreme Value Theory for Robust Railway Track Inspection

Xavier Gibert, Vishal M. Patel, Rama Chellappa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Periodic inspections are necessary to keep railroad tracks in state of good repair and prevent train accidents. Automatic track inspection using machine vision technology has become a very effective inspection tool. Because of its non-contact nature, this technology can be deployed on virtually any railway vehicle to continuously survey the tracks and send exception reports to track maintenance personnel. However, as appearance and imaging conditions vary, false alarm rates can dramatically change, making it difficult to select a good operating point. In this paper, we use extreme value theory (EVT) within a Bayesian framework to optimally adjust the sensitivity of anomaly detectors. We show that by approximating the lower tail of the probability density function (PDF) of the scores with an Exponential distribution (a special case of the Generalized Pareto distribution), and using the Gamma conjugate prior learned from the training data, it is possible to reduce the variability in false alarm rate and improve the overall performance. This method has shown an increase in the defect detection rate of rail fasteners in the presence of clutter (at PFA 0.1%) from 95.40% to 99.26% on the 85-mile Northeast Corridor (NEC) 2012-2013 concrete tie dataset.

Original languageEnglish (US)
Title of host publicationProceedings - 2015 IEEE International Conference on Computer Vision Workshops, ICCVW 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages131-138
Number of pages8
ISBN (Electronic)9781467383905
DOIs
StatePublished - Feb 11 2016
Externally publishedYes
Event15th IEEE International Conference on Computer Vision Workshops, ICCVW 2015 - Santiago, Chile
Duration: Dec 11 2015Dec 18 2015

Publication series

NameProceedings of the IEEE International Conference on Computer Vision
Volume2015-February
ISSN (Print)1550-5499

Conference

Conference15th IEEE International Conference on Computer Vision Workshops, ICCVW 2015
Country/TerritoryChile
CitySantiago
Period12/11/1512/18/15

Keywords

  • Bayes methods
  • Detectors
  • Fasteners
  • Feature extraction
  • Indexes
  • Inspection
  • Robustness

ASJC Scopus subject areas

  • Software
  • Computer Vision and Pattern Recognition

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