Abstract
Lateral polysilicon P+-N-N+ and P+-P-N+ diodes were fabricated and their electrical properties such as ON current, reverse current and series resistance were studied at various temperatures in the range of 50°C to 150°C. It was found that both reverse and forward currents of the diodes increased with the temperature. Using these electrical properties as parameters, the lateral polysilicon diodes can be used as temperature sensors in microreaction systems.
Original language | English (US) |
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Title of host publication | 2001 International Semiconductor Device Research Symposium, ISDRS 2001 - Proceedings |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 174-177 |
Number of pages | 4 |
ISBN (Electronic) | 0780374320, 9780780374324 |
DOIs | |
State | Published - 2001 |
Externally published | Yes |
Event | International Semiconductor Device Research Symposium, ISDRS 2001 - Washington, United States Duration: Dec 5 2001 → Dec 7 2001 |
Other
Other | International Semiconductor Device Research Symposium, ISDRS 2001 |
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Country/Territory | United States |
City | Washington |
Period | 12/5/01 → 12/7/01 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials