Microcomputed tomography with a second generation photon-counting x-ray detector - Contrast analysis and material separation

X. Wang, D. Meier, P. Oya, G. E. Maehlum, D. J. Wagenaar, B. M.W. Tsui, B. E. Patt, E. C. Frey

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

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Keyphrases

Material Science

Physics