TY - JOUR
T1 - Metal-Enhanced Fluorescence (MEF)
T2 - Physical characterization of Silver-island films and exploring sample geometries
AU - Pribik, R.
AU - Dragan, A. I.
AU - Zhang, Y.
AU - Gaydos, C.
AU - Geddes, C. D.
N1 - Funding Information:
The authors would like to thank the NIH/NIBIB 1U54EB007958-1 for financial support. The authors also thank UMBI and the IoF for salary support.
PY - 2009/8/17
Y1 - 2009/8/17
N2 - In this study we have analyzed metal-enhanced fluorescence (MEF) effects from different density Silver-island films (SiFs) and the effects of sample geometry on the observed enhancement of fluorescence (EF). It is shown that silver islands grow exponentially with SiF deposition time (DT < 5 min), optical density of SiFs almost linearly depends on DT; electrical conductivity is zero. At DT > 5 min, silver islands merge, exhibiting a sharp increase in electrical conductivity. It has been shown that the newly proposed SiF sample geometry exhibits higher EF values than the commonly used in MEF studies SiF-SiF sample geometry. The SiF-glass geometry demonstrates high sensitivity for surface immunoassays, a growing application of metal-enhanced fluorescence.
AB - In this study we have analyzed metal-enhanced fluorescence (MEF) effects from different density Silver-island films (SiFs) and the effects of sample geometry on the observed enhancement of fluorescence (EF). It is shown that silver islands grow exponentially with SiF deposition time (DT < 5 min), optical density of SiFs almost linearly depends on DT; electrical conductivity is zero. At DT > 5 min, silver islands merge, exhibiting a sharp increase in electrical conductivity. It has been shown that the newly proposed SiF sample geometry exhibits higher EF values than the commonly used in MEF studies SiF-SiF sample geometry. The SiF-glass geometry demonstrates high sensitivity for surface immunoassays, a growing application of metal-enhanced fluorescence.
UR - http://www.scopus.com/inward/record.url?scp=68049087758&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=68049087758&partnerID=8YFLogxK
U2 - 10.1016/j.cplett.2009.07.033
DO - 10.1016/j.cplett.2009.07.033
M3 - Article
AN - SCOPUS:68049087758
SN - 0009-2614
VL - 478
SP - 70
EP - 74
JO - Chemical Physics Letters
JF - Chemical Physics Letters
IS - 1-3
ER -