Abstract
Bismuth is a semimetal with unusual transport properties, such as long mean free path and large magnetoresistance (MR) effect. Here we report on the influence of deposition potential, Bi(III) concentration, and thickness on the microstructure and morphology of bismuth thin films. Polycrystalline bismuth films were deposited on gold from bismuth nitrate solution. The texture of the films is strongly dependent on deposition potential and Bi(III) concentration, but only weakly dependent on film thickness. The film morphology is strongly dependent on deposition potential and on film thickness. The magnetoresistance (MR) of the as-deposited films was highly dependent film morphology and grain size. Understanding the structure-property relationships is an important first step in optimizing the transport properties of as-deposited films and patterned features.
Original language | English (US) |
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Pages (from-to) | 12018-12023 |
Number of pages | 6 |
Journal | Journal of Physical Chemistry C |
Volume | 112 |
Issue number | 31 |
DOIs | |
State | Published - Aug 7 2008 |
Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- General Energy
- Physical and Theoretical Chemistry
- Surfaces, Coatings and Films