Large purely refractive nonlinear index of single crystal P-toluene sulphonate (PTS) at 1600nm

B. L. Lawrence, M. Cha, J. U. Kang, W. Torruellas, G. Stegeman, G. Baker, J. Meth, S. Etemad

Research output: Contribution to journalArticlepeer-review

Abstract

Z-scan measurements at 1600 nm on single-crystal PTS (p-toluene sulfonate) with single, 65 ps pulses gave a complex nonlinear refractive index coefficient of n2= 2.2(±0.3) × 10-12cm2AV at 1GW/cm2and α20.5cm/GW. This is the first highly nonlinear, organic material to satisfy the conditions imposed by the figures of merit.

Original languageEnglish (US)
Pages (from-to)447-448
Number of pages2
JournalElectronics Letters
Volume30
Issue number5
DOIs
StatePublished - 1994
Externally publishedYes

Keywords

  • Nonlinear optics
  • Refractive index measurement

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Large purely refractive nonlinear index of single crystal P-toluene sulphonate (PTS) at 1600nm'. Together they form a unique fingerprint.

Cite this