First Born model for reflection-mode Fourier ptychographic microscopy

Alex Matlock, Anne Sentenac, Ji Yi, Lei Tian

Research output: Chapter in Book/Report/Conference proceedingConference contribution


We validate a first Born approximation based model for Reflection-mode Fourier ptychography under the semi-infinite boundary condition. Our model enables optical thickness and absorption recovery with enhanced resolution from thin samples.

Original languageEnglish (US)
Title of host publicationMathematics in Imaging, MATH 2018
PublisherOptica Publishing Group (formerly OSA)
ISBN (Print)9781943580446
StatePublished - 2018
Externally publishedYes
EventMathematics in Imaging, MATH 2018 - Orlando, United States
Duration: Jun 25 2018Jun 28 2018

Publication series

NameOptics InfoBase Conference Papers
VolumePart F105-MATH 2018
ISSN (Electronic)2162-2701


ConferenceMathematics in Imaging, MATH 2018
Country/TerritoryUnited States

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials


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