@inproceedings{15385eb41215430795d5a23cccbdafae,
title = "Explainable Deep Learning Applied to Understanding Opioid Use Disorder and Its Risk Factors",
abstract = "Opioid Use Disorder is an international crisis, affecting many populations. Deep learning models can potentially predict opioid use disorder, but provide little insight to how predictions are derived. Impact scores, a new development in explainable artificial intelligence, measure how individual features affect deep learning outcomes. We modeled clinical visits to predict opioid use disorder, computed impact scores, and compared them to odds log ratios from logistic regression. Impact scores were generally comparable to odds log ratios, in providing insight to opioid abuse risk, but from a better-performing method than logistic regression.",
keywords = "Deep Learning, Explainable AI, Impact Scores, Opioid Use Disorder",
author = "Workman, {T. Elizabeth} and Qing Zeng-Treitler and Yijun Shao and Joel Kupersmith and Friedhelm Sandbrink and Goulet, {Joseph L.} and Shaar, {Nawar M.} and Christopher Spevak and Cynthia Brandt and Blackman, {Marc R.}",
note = "Funding Information: ACKNOWLEDGMENT The views expressed are those of the authors and do not necessarily reflect those of the Department of Veterans Affairs, the United States Government, or the academic affiliate organizations. This work was supported by VA Project SIP 18-329 Utilization of Opioids in Post 9/11 Veterans in the VA Community, and NIH grants UL1TR001876 and KL2TR001877 from the National Center for Advancing Translational Sciences. Funding Information: Funding for this research was provided in whole or in part by VHA project SIP 18–329, and NIH grants UL1TR001876 and KL2TR001877 from the National Center for Advancing Translational Sciences. XXX-X-XXXX-XXXX-X/XX/$XX.00 {\textcopyright}20XX IEEE Publisher Copyright: {\textcopyright} 2019 IEEE.; 2019 IEEE International Conference on Big Data, Big Data 2019 ; Conference date: 09-12-2019 Through 12-12-2019",
year = "2019",
month = dec,
doi = "10.1109/BigData47090.2019.9006297",
language = "English (US)",
series = "Proceedings - 2019 IEEE International Conference on Big Data, Big Data 2019",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "4883--4888",
editor = "Chaitanya Baru and Jun Huan and Latifur Khan and Hu, {Xiaohua Tony} and Ronay Ak and Yuanyuan Tian and Roger Barga and Carlo Zaniolo and Kisung Lee and Ye, {Yanfang Fanny}",
booktitle = "Proceedings - 2019 IEEE International Conference on Big Data, Big Data 2019",
}