Erratum: Determining the electronic properties of individual nanointerfaces by combining intermittent AFM imaging and contact spectroscopy (IEEE Transactions on Nanotechnology (2010) 9:6 (741-744))

Ramsey A. Kraya, Dawn A. Bonnell

Research output: Contribution to journalComment/debatepeer-review

Original languageEnglish (US)
Article number5705642
Number of pages1
JournalIEEE Transactions on Nanotechnology
Issue number1
StatePublished - Jan 1 2011

ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering

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